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A Journal of Russian Academy of Sciences
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IssuesArchive of Issues2024-4pp.2301-2321

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Khaled Lotfy, Alaa El-Bary, Eslam Elidy, Ramdan Tantawi, Abdelaala Ahmed, Mohamed S. Mohamed, and A.M.S. Mahdy, "A Novel Model of Stochastic Photo-Elasto-Thermodiffusion Waves Interaction in Semiconductors," Mech. Solids. 59 (4), 2301-2321 (2024)
Year 2024 Volume 59 Number 4 Pages 2301-2321
DOI 10.1134/S002565442460452X
Title A Novel Model of Stochastic Photo-Elasto-Thermodiffusion Waves Interaction in Semiconductors
Author(s) Khaled Lotfy (Department of Mathematics, Faculty of Science, Zagazig University, Zagazig, Egypt; Department of Mathematics, College of Science, Taibah University, Al-Madinah Al-Munawarah, 30002 Saudi Arabia, khlotfy_1@yahoo.com)
Alaa El-Bary (Arab Academy for Science, Technology and Maritime Transport, Alexandria, Egypt; Council of futuristic studies and risk management, Academy of Scientific Research and Technology, Cairo, Egypt, aaelbary@aast.edu)
Eslam Elidy (Department of Mathematics, Faculty of Science, Zagazig University, Zagazig, Egypt, eslamelidy@yahoo.com)
Ramdan Tantawi (Department of Mathematics, Faculty of Science, Zagazig University, Zagazig, Egypt, ramadan_tantawi1@yahoo.com)
Abdelaala Ahmed (Department of Mathematics, Faculty of Science, Zagazig University, Zagazig, Egypt, abdoahmed199590@gmail.com)
Mohamed S. Mohamed (Department of Mathematics and Statistics, College of Science, Taif University, Taif, 21944 Saudi Arabia, m.saaad@tu.edu.sa)
A.M.S. Mahdy (Department of Mathematics and Statistics, College of Science, Taif University, Taif, 21944 Saudi Arabia, amr_mahdy85@yahoo.com)
Abstract The implementation of a stochastic simulation was carried out using an elastic-thermodiffusion (ETD) model of the electrons-holes interaction problem, utilizing photo-thermoelastic theory. This study investigates deformations in a two-dimensional (2D) context, incorporating the influences of thermoelastic (TD) and electronic (ED) transport mechanisms. The use of a Weiner function or white noise with a boundary condition introduces a stochastic component, hence enhancing the realism of the problem. The normal mode analysis was employed to obtain deterministic and stochastic outcomes for all physical quantities. Three unique paths are developed to evaluate the dispersion of the stochastic and deterministic fields. The mean and standard deviation of the most pertinent physical variables are calculated and examined. Silicon (Si) semiconductor materials are utilized for modeling and analysis. The study included the provision of graphs and discussions about the obtained results.
Keywords stochastic, white noise, electrons, holes, thermo-diffusion, semiconductors
Received 08 July 2024Revised 02 August 2024Accepted 04 August 2024
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