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A Journal of Russian Academy of Sciences
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IssuesArchive of Issues2023-5pp.1606-1614

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Y.P. Zhao and D.Z. Li, "Extensional Analysis of an Axially Loaded Functionally Graded Piezoelectric Semiconductor Rod with Electrical Nonlinearity," Mech. Solids. 58 (5), 1606-1614 (2023)
Year 2023 Volume 58 Number 5 Pages 1606-1614
DOI 10.3103/S0025654423600472
Title Extensional Analysis of an Axially Loaded Functionally Graded Piezoelectric Semiconductor Rod with Electrical Nonlinearity
Author(s) Y.P. Zhao (Luohe Vocational Technology College, Luohe, 462000 China)
D.Z. Li (School of Materials and Energy, University of Electronic Science and Technology of China, Chengdu, 610054 China; Department of Engineering Mechanics, Zhejiang University, Hangzhou, 310027 China, dezhi.li@zju.edu.cn)
Abstract Based on the nonlinear constitutive equations, we investigate an axially loaded functionally graded piezoelectric semiconductor (FGPS) rod. For the FGPS rod with a linear graded distribution of elastic constants along the axial direction, the one-dimensional (1D) nonlinear coupled equations for pure extensional deformation rod with electrical nonlinearity are presented. The classical Newton-Raphson method is used to solve such a nonlinear problem. The multi-field coupling responses of the axially loaded FGPS rod under different initial concentrations of electrons, axial forces, and gradient factors are numerically studied. Numerical results show the gradient factor as well as the initial concentration of electrons has a significant effect on the distribution of each physical field in the FGPS rod, and could be helpful for the development of semiconductor devices with functionally graded piezoelectric semiconductor structures.
Keywords functionally graded materials, piezoelectric semiconductor rod, electrical nonlinearity, Newton-Raphson method, multi-field coupling
Received 30 May 2023Revised 24 July 2023Accepted 25 July 2023
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