Mechanics of Solids (about journal) Mechanics of Solids
A Journal of Russian Academy of Sciences
 Founded
in January 1966
Issued 6 times a year
Print ISSN 0025-6544
Online ISSN 1934-7936

Russian Russian English English About Journal | Issues | Guidelines | Editorial Board | Contact Us
 


IssuesArchive of Issues2013-2pp.216-227

Archive of Issues

Total articles in the database: 11223
In Russian (Èçâ. ÐÀÍ. ÌÒÒ): 8011
In English (Mech. Solids): 3212

<< Previous article | Volume 48, Issue 2 / 2013 | Next article >>
S.A. Kukushkin and A.V. Osipov, "A New Mechanism of Elastic Energy Relaxation in Heteroepitaxy of Monocrystalline Films: Interaction of Point Defects and Dilatation Dipoles," Mech. Solids. 48 (2), 216-227 (2013)
Year 2013 Volume 48 Number 2 Pages 216-227
DOI 10.3103/S0025654413020143
Title A New Mechanism of Elastic Energy Relaxation in Heteroepitaxy of Monocrystalline Films: Interaction of Point Defects and Dilatation Dipoles
Author(s) S.A. Kukushkin (Institute for Problems in Mechanical Engineering, Russian Academy of Sciences, Bol'shoy pr-t 61, St. Petersburg, 199178 Russia, kukushkin_s@yahoo.com)
A.V. Osipov (Institute for Problems in Mechanical Engineering, Russian Academy of Sciences, Bol'shoy pr-t 61, St. Petersburg, 199178 Russia)
Abstract A new method for growing a low-defect elastic-stress-free silicon carbide film on silicon substrates is theoretically developed and experimentally implemented. In this method, the relaxation of inevitable elastic stresses is attained by an essentially new mechanism, namely, by dilatation dipoles (stable complexes consisting of attracting dilatation centers) formed by a carbon atom in interstitial position and a silicon vacancy. The tensor Green function for elastic-anisotropic media is used to obtain the dependence of the point defect interaction energy on their mutual crystallographic location in silicon. It is shown that the situation where the dilatation dipole is perpendicular to the plane (111) is most efficient for a cubic crystal. In this case, practically the whole elastic energy of the film dilatation can be relaxed only at the expense of dipoles, and this must produce a high quality of silicon carbide films.

The assembly of nanoscale silicon carbide films on a silicon substrate was realized for the first time in practice by synthesis of dilatation dipoles, which play the role of molecular seeds. Highly perfect carbide layers were grown on silicon substrate, and all of their basic characteristics were measured. Such films were for the first time used to produce a wide-band light-emitting diode structure on silicon.
Keywords heteroepitaxy, point defect interaction, elastic energy relaxation, dilatation centers
References
1.  T. Li et al. (Editors), III-V Semiconductors: Integration with Silicon-Based Microelectronics (CRC Press, Boca Raton, 2011).
2.  S. A. Kukushkin and A. V. Osipov, "New Method for Growing Silicon Carbide on Silicon by Solid-Phase Epitaxy: Model and Experiment," Fiz. Tverd. Tela 50 (7), 1188-1195 (2008) [Phys. Solid State (Engl. Transl.) 50 (7), 1238-1245 (2008)].
3.  S. A. Kukushkin, A. V. Osipov, N. A. Feoktistov, "Method for Manufacturing an Article Containing a Silicon Substrate with Carbide Film on Its Surface," RF Patent No. 2 363 067 (January 22, 2008; Published on July 27, 2009), Bulletin No. 21.
4.  L. M. Sorokin, A. K. Kalmykov, V. N. Bessolov, et al., "Structural Characterization of GaN Epilayers on Silicon: Effect of Buffer Layers," Pis'ma Zh. Teoret. Fiz. 37 (7), 72-79 (2011) [Tech. Phys. Lett. (Engl. Transl.) 37 (4), 326-329 (2011)].
5.  J. D. Eshelby, Continual Theory of Defects, in Continual Theory of Dislocations (Inostr. Liter., Moscow, 1963), pp. 11-102 [in Russian].
6.  C. Teodosiu, Elastic Models of Crystal Defects (Editura Academiei, 1982; Mir, Moscow, 1985).
7.  T. Mura, Micromechanics of Defects in Solids (Kluwer, Dordrecht, 1987).
8.  R. D. Mindlin, "Force at a Point in the Interior of Semi-Infinite Solid," in Midwestern Conf. Solid Mech. (1953), pp. 56-59.
9.  I. M. Lifshits and L. N. Rosentsveig, "On Construction of Green's Tensor for the Basic Equation of Elasticity in the Case of Unbounded Elastoanisotropic Medium," Zh. Vych. Mat. Mat. Fiz. 17 (9), 783-791 (1947).
10.  G. Leibfried, "Über den Einfluss Thermisch Angeregten Schallwellen auf die Plastische Deformation," Z. Phys. 127, 334-356 (1950).
11.  M. A. Krivoglaz, Theory of X-Ray and Thermal-Neutron Scattering by Real Crystals (Nauka, Moscow, 1967; Plenum Press, New York 1969).
12.  V. V. Kokorin, "Elastic Interaction between Dilating Coherent Particles in an Elastoanisotropic Medium," Fiz. Metal. Metalloved. 47 (2), 438-440 (1979).
13.  R. Seims, "Mechanical Interaction of Point Defects," Phys. Stat. Sci. 30 (2), 645-658 (1968).
14.  A. A. Katsnelson and A. I. Olemskii, Microscopic Theory of Inhomogeneous Structures (Izd-VO MGU, Moscow, 1987) [in Russian].
15.  I. M. Lifshits and L. V. Tanatarov, "On Elastic Interaction of Impurity Atoms in Crystal," Fiz. Metal. Metalloved. 12 (3), 331-337 (1961).
16.  P. A. Flinn and A. A. Maradulin, "Distortion of Crystals by Point Defects," Ann. Phys. 18 (3), 81-109 (1962).
17.  V. K. Vainstein, V. M. Fridkin, and V. L. Indenbom, Contemporary Crystallography, Vol. 2: Structure of Crystals, Ed. by V. K. Vainstein et al. (Nauka, Moscow, 1979) [in Russian].
18.  Meijie Tang, L. Colombo, Jing Zhu, and T. Diaz de la Rubia, "Intrinsic Point Defects in Crystalline Silicon: Tight-Binding Molecular Dynamics Studies of Self-Diffusion, Interstitial-Vacancy Recombination, and Formation Volumes," Phys. Rev. B 55 (21), 14279-14289 (1997).
19.  L. I. Fedina, "Recombination of Point Defects and Their Interaction with the Surface in the Course of the Clusterization of these Defects in Si," Fiz. Tekhn. Poluprov. 35 (9), 1120-1127 (2001) [Semicond. (Engl. Transl.) 35 (9), 1072-1180 (2001)].
20.  J. Christian, The Theory of Transformations in Metals and Alloys Part I (Pergamon, Oxford, 2002; Mir, Moscow, 2008).
21.  W. J. Scotten, Diffusion in Silicon (LLC, 2008).
22.  L. S. Palatnik, V. M. Koshkin, E. K. Belova, and E. I. Rogacheva, "On Semiconductor Phases of Variable Composition," in Compounds of Variable Composition, Ed. by V. B. Ormont (Khimiya, Leningrad, 1969), pp. 412-455 [in Russian].
23.  S. A. Kukushkin and A. V. Osipov, "Processes of Thin Film Condensation," Uspekhi Fiz. Nauk 168 (10), 1083-1116 (1998).
24.  S. A. Kukushkin, A. V. Osipov, S. G. Zhukov, et al., "Group-III-Nitride-Based Light-Emitting Diode on Silicon Substrate with Epitaxial Nanolayer of Silicon Carbide," Pis'ma Zh. Teoret. Fiz. 38 (6), 90-95 (2012) [Tech. Phys. Lett. (Engl. Transl.) 38 (3), 297-299 (2012)].
Received 28 October 2011
Link to Fulltext
<< Previous article | Volume 48, Issue 2 / 2013 | Next article >>
Orphus SystemIf you find a misprint on a webpage, please help us correct it promptly - just highlight and press Ctrl+Enter

101 Vernadsky Avenue, Bldg 1, Room 246, 119526 Moscow, Russia (+7 495) 434-3538 mechsol@ipmnet.ru https://mtt.ipmnet.ru
Founders: Russian Academy of Sciences, Ishlinsky Institute for Problems in Mechanics RAS
© Mechanics of Solids
webmaster
Rambler's Top100